WELCH MEMORIAL LECTURE - THE DEVELOPMENT OF PHOTOEMISSION SPECTROSCOPY AND ITS APPLICATION TO THE STUDY OF SEMICONDUCTOR INTERFACES - OBSERVATIONS ON THE INTERPLAY BETWEEN BASIC AND APPLIED-RESEARCH

被引：8

作者：

SPICER, WE

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1985年 / 3卷 / 03期

关键词：

D O I：

10.1116/1.573016

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：461 / 470

页数：10

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