SPECIMEN SURFACE EFFECTS IN THICK-TARGET PIXE ANALYSIS

被引：12

作者：

COOKSON, JA ^{[1
]}

CAMPBELL, JL ^{[1
]}

机构：

[1] UNIV GUELPH,GUELPH WATERLOO PROGRAM GRAD WORK PHYS,GUELPH N1G 2W1,ONTARIO,CANADA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 216卷 / 03期

关键词：

D O I：

10.1016/0167-5087(83)90517-3

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：489 / 495

页数：7

共 7 条

AHLBERG, M ;

AKSELSSON, R .

INTERNATIONAL JOURNAL OF APPLIED RADIATION AND ISOTOPES, 1976, 27 (5-6) :279-290

[2]

ANDERSEN HH, 1977, STOPPING POWERS RANG, V2

[3] UNCERTAINTIES IN THICK-TARGET PIXE ANALYSIS [J].

CAMPBELL, JL ;

COOKSON, JA ;

PAUL, H .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 212 (1-3) :427-439

[4] UNCERTAINTIES IN THEORETICAL THICK TARGET PIXE YIELDS [J].

CLAYTON, E .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1981, 191 (1-3) :567-572

[5] ANALYTICAL APPLICATION OF PARTICLE INDUCED X-RAY-EMISSION [J].

JOHANSSON, SAE ;

JOHANSSON, TB .

NUCLEAR INSTRUMENTS & METHODS, 1976, 137 (03) :473-516

[6]

LEROUX J, 1977, REVISED TABLES XRAY

SCHIEKEL, M .

ISOTOPENPRAXIS, 1977, 13 (04) :133-135