LOW-FREQUENCY GENERATION NOISE IN JUNCTION FIELD EFFECT TRANSISTORS

[11] CARRIER GENERATION AND RECOMBINATION IN P-N JUNCTIONS AND P-N JUNCTION CHARACTERISTICS [J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1957, 45 (09): : 1228 - 1243

[12] SAH CT, 1964, P I ELECT ELECTRON E

[13] SAH CT, 1964, I ELECT ELECTRON ENG, VED11

[14] ELECTRONS, HOLES, AND TRAPS [J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1958, 46 (06): : 973 - 990

[15] STATISTICS OF THE RECOMBINATIONS OF HOLES AND ELECTRONS [J]. PHYSICAL REVIEW, 1952, 87 (05): : 835 - 842

[16] A UNIPOLAR FIELD-EFFECT TRANSISTOR [J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1952, 40 (11): : 1365 - 1376

[17] GATE NOISE IN FIELD EFFECT TRANSISTORS AT MODERATELY HIGH FREQUENCIES [J]. PROCEEDINGS OF THE IEEE, 1963, 51 (03) : 461 - &

[18] VANDERZIEL A, 1962, P IRE, V50, P1808

[19] CARRIER DENSITY FLUCTUATION NOISE IN FIELD-EFFECT TRANSISTORS [J]. PROCEEDINGS OF THE IEEE, 1963, 51 (11) : 1671 - &

[20] VANDERZIEL A, 1959, FLUCTUATION PHENOMEN, P22

[11] CARRIER GENERATION AND RECOMBINATION IN P-N JUNCTIONS AND P-N JUNCTION CHARACTERISTICS [J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1957, 45 (09): : 1228 - 1243

[12] SAH CT, 1964, P I ELECT ELECTRON E

[13] SAH CT, 1964, I ELECT ELECTRON ENG, VED11

[14] ELECTRONS, HOLES, AND TRAPS [J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1958, 46 (06): : 973 - 990

[15] STATISTICS OF THE RECOMBINATIONS OF HOLES AND ELECTRONS [J]. PHYSICAL REVIEW, 1952, 87 (05): : 835 - 842

[16] A UNIPOLAR FIELD-EFFECT TRANSISTOR [J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1952, 40 (11): : 1365 - 1376

[17] GATE NOISE IN FIELD EFFECT TRANSISTORS AT MODERATELY HIGH FREQUENCIES [J]. PROCEEDINGS OF THE IEEE, 1963, 51 (03) : 461 - &

[18] VANDERZIEL A, 1962, P IRE, V50, P1808

[19] CARRIER DENSITY FLUCTUATION NOISE IN FIELD-EFFECT TRANSISTORS [J]. PROCEEDINGS OF THE IEEE, 1963, 51 (11) : 1671 - &

[20] VANDERZIEL A, 1959, FLUCTUATION PHENOMEN, P22