ELECTRONIC-STRUCTURE OF SI(111) SURFACES

[1] WORK FUNCTION, PHOTOELECTRIC THRESHOLD, AND SURFACE STATES OF ATOMICALLY CLEAN SILICON [J]. PHYSICAL REVIEW, 1962, 127 (01): : 150 - &

[2] SI(2X1) SURFACE - THEORY OF ITS SPECTROSCOPY [J]. PHYSICAL REVIEW B, 1975, 12 (04): : 1410 - 1417

[3] CORE-LEVEL BINDING-ENERGY SHIFTS DUE TO RECONSTRUCTION ON THE SI(111) 2X1 SURFACE [J]. PHYSICAL REVIEW LETTERS, 1980, 45 (17) : 1414 - 1418

[4] ELECTRONIC STATES AND ELECTRON-PHONON COUPLING AT THE 2X1 RECONSTRUCTED SI(111) SURFACE [J]. SOLID STATE COMMUNICATIONS, 1981, 37 (06) : 495 - 499

[5] ENERGY-MINIMIZATION APPROACH TO ATOMIC GEOMETRY OF SEMICONDUCTOR SURFACES [J]. PHYSICAL REVIEW LETTERS, 1978, 41 (15) : 1062 - 1065

[6] THEORETICAL-STUDIES OF SI(111) SURFACE-STRUCTURES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (03): : 856 - 859

[7] NEW INTERPRETATION OF ANGULAR-RESOLVED PHOTOEMISSION MEASUREMENTS FROM CLEAVED SILICON [J]. SOLID STATE COMMUNICATIONS, 1976, 18 (08) : 1149 - 1152

[8] DELSOLE R, 1981, PHYS REV B, V24, P7430

[9] THE (1X1) STRUCTURE OF SI(111) - STRONG CORRELATIONS IN SURFACE-STATE BANDS [J]. SURFACE SCIENCE, 1981, 111 (02) : L685 - L689

[10] MOMENTUM-RESOLVED BREMSSTRAHLUNG SPECTROSCOPY WITH A TUNABLE PHOTON DETECTOR [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (02): : 1111 - 1114

[1] WORK FUNCTION, PHOTOELECTRIC THRESHOLD, AND SURFACE STATES OF ATOMICALLY CLEAN SILICON [J]. PHYSICAL REVIEW, 1962, 127 (01): : 150 - &

[2] SI(2X1) SURFACE - THEORY OF ITS SPECTROSCOPY [J]. PHYSICAL REVIEW B, 1975, 12 (04): : 1410 - 1417

[3] CORE-LEVEL BINDING-ENERGY SHIFTS DUE TO RECONSTRUCTION ON THE SI(111) 2X1 SURFACE [J]. PHYSICAL REVIEW LETTERS, 1980, 45 (17) : 1414 - 1418

[4] ELECTRONIC STATES AND ELECTRON-PHONON COUPLING AT THE 2X1 RECONSTRUCTED SI(111) SURFACE [J]. SOLID STATE COMMUNICATIONS, 1981, 37 (06) : 495 - 499

[5] ENERGY-MINIMIZATION APPROACH TO ATOMIC GEOMETRY OF SEMICONDUCTOR SURFACES [J]. PHYSICAL REVIEW LETTERS, 1978, 41 (15) : 1062 - 1065

[6] THEORETICAL-STUDIES OF SI(111) SURFACE-STRUCTURES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (03): : 856 - 859

[7] NEW INTERPRETATION OF ANGULAR-RESOLVED PHOTOEMISSION MEASUREMENTS FROM CLEAVED SILICON [J]. SOLID STATE COMMUNICATIONS, 1976, 18 (08) : 1149 - 1152

[8] DELSOLE R, 1981, PHYS REV B, V24, P7430

[9] THE (1X1) STRUCTURE OF SI(111) - STRONG CORRELATIONS IN SURFACE-STATE BANDS [J]. SURFACE SCIENCE, 1981, 111 (02) : L685 - L689

[10] MOMENTUM-RESOLVED BREMSSTRAHLUNG SPECTROSCOPY WITH A TUNABLE PHOTON DETECTOR [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (02): : 1111 - 1114