TOPOGRAPHIC INTENSITY PROFILES IN SCANNING ELECTRON MICROSCOPE CUBES

被引：8

作者：

GEORGE, EP

ROBINSON, VNE

机构：

[1] UNIV NEW S WALES,SCH PHYS,KENSINGTON 2033,NEW S WALES,AUSTRALIA

[2] UNIV NEW S WALES,FAC APPL SCI,KENSINGTON,NEW S WALES,AUSTRALIA

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1975年 / 105卷 / DEC期

关键词：

D O I：

10.1111/j.1365-2818.1975.tb04062.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：289 / 298

页数：10

共 14 条

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[3]

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[4]

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[5]

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[6] AN IMPROVED SCANNING ELECTRON MICROSCOPE FOR OPAQUE SPECIMENS [J].

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[7]

Murata K., 1973, Scanning Electron Microscopy 1973, P267

[8] STUDY ON RESOLUTION OF BACKSCATTERED ELECTRON IMAGE BY MONTE CARLO METHOD [J].

MURATA, K ;

MATSUKAWA, T ;

SHIMIZU, R .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1971, 10 (09) :1290-+

[9] MONTE CARLO CALCULATIONS ON ELECTRON SCATTERING IN A SOLID TARGET [J].

MURATA, K ;

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[10]

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