REAL-TIME AND STROBOSCOPIC TOPOGRAPHY

被引:12
作者
TANNER, BK
CRINGEAN, JK
机构
来源
PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS | 1987年 / 14卷
关键词
D O I
10.1016/0146-3535(87)90024-4
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
收藏
页码:403 / 424
页数:22
相关论文
共 66 条
[1]   A STUDY OF DKDP AND KDP CRYSTALS IN AN APPLIED ELECTRIC-FIELD BY SYNCHROTRON RADIATION TOPOGRAPHY [J].
ALESHKOOZHEVSKIJ, OP ;
BOWEN, DK ;
DAVIES, ST .
FERROELECTRICS, 1985, 62 (1-2) :53-58
[2]  
[Anonymous], 1976, XRAY DIFFRACTION TOP
[3]  
Berolo O., 1977, P 1977 ULTR S, P98, DOI [10.1109/ULTSYM.1977.196802, DOI 10.1109/ULTSYM.1977.196802]
[4]   THEORIE DER AUSBREITUNG VON RONTGEN-WELLENFELDSTRAHLEN IM SCHWACH DEFORMIERTEN KRISTALLGITTER [J].
BONSE, U .
ZEITSCHRIFT FUR PHYSIK, 1964, 177 (04) :385-&
[5]  
Bonse U., 1980, Characterization of Crystal Growth Defects by X-Ray Methods. Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods, P298
[6]   THE X-RAY TOPOGRAPHY STATION AT DARESBURY LABORATORY [J].
BOWEN, DK ;
CLARK, GF ;
DAVIES, ST ;
NICHOLSON, JRS ;
ROBERTS, KJ ;
SHERWOOD, JN ;
TANNER, BK .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 195 (1-2) :277-284
[7]   CONTRAST INVESTIGATIONS OF SURFACE ACOUSTIC-WAVES BY STROBOSCOPIC TOPOGRAPHY .2. WAVEFIELD DEVIATION CONTRAST [J].
CERVA, H ;
GRAEFF, W .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1985, 87 (02) :507-516
[8]   CONTRAST INVESTIGATIONS OF SURFACE ACOUSTIC-WAVES BY STROBOSCOPIC TOPOGRAPHY .1. ORIENTATION CONTRAST [J].
CERVA, H ;
GRAEFF, W .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1984, 82 (01) :35-45
[9]   HIGH-RESOLUTION REAL-TIME X-RAY TOPOGRAPHY OF DISLOCATION GENERATION IN SILICON [J].
CHANG, SL ;
QUEISSER, HJ ;
BAUMGART, H ;
HAGEN, W ;
HARTMANN, W .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1982, 46 (06) :1009-1013
[10]  
Chikawa J., 1980, Characterization of Crystal Growth Defects by X-Ray Methods. Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods, P368