HIGHLY SENSITIVE NOVOLAK-BASED X-RAY POSITIVE RESIST

被引:10
作者
LINGNAU, J
DAMMEL, R
THEIS, J
机构
关键词
D O I
10.1002/pen.760291309
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
引用
收藏
页码:874 / 877
页数:4
相关论文
共 16 条
  • [1] BUHR G, Patent No. 2610842
  • [2] BUHR G, 1978, Patent No. 2718259
  • [3] CHLEBEK J, 1988, IN PRESS MICROCIRCUI, V7
  • [4] DEVELOPMENTS IN THE DESIGN AND APPLICATIONS OF NOVEL THERMAL AND PHOTOCHEMICAL INITIATORS FOR CATIONIC POLYMERIZATION
    CRIVELLO, JV
    LEE, JL
    CONLON, DA
    [J]. MAKROMOLEKULARE CHEMIE-MACROMOLECULAR SYMPOSIA, 1988, 13-4 : 145 - 160
  • [5] PHOTOCATALYTIC NOVOLAK-BASED POSITIVE RESIST FOR X-RAY LITHOGRAPHY - KINETICS AND SIMULATION.
    Dammel, R.
    Doessel, K.F.
    Lingnau, J.
    Theis, J.
    Huber, H.L.
    Oertel, H.
    [J]. Microelectronic Engineering, 1987, 6 (1-4) : 503 - 509
  • [6] FRECHET JMJ, 1986, J IMAGING SCI, V30, P59
  • [7] Gozdz A. S., 1986, Proceedings of the SPIE - The International Society for Optical Engineering, V631, P2, DOI 10.1117/12.963618
  • [8] ITO H, 1984, ACS SYM SER, V242, P11
  • [9] CHEMICAL AMPLIFICATION IN THE DESIGN OF DRY DEVELOPING RESIST MATERIALS
    ITO, H
    WILLSON, CG
    [J]. POLYMER ENGINEERING AND SCIENCE, 1983, 23 (18) : 1012 - 1018
  • [10] ITO H, 1988, IN PRESS 32ND INT S