AUTODOPING OF ANTIMONY AND ARSENIC IN SILICON EPITAXIAL LAYERS

被引:1
作者
KATONA, P
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D O I
10.1016/0040-6090(83)90224-9
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T [工业技术];
学科分类号
08 ;
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页码:9 / 15
页数:7
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[1]  
Ambrozy A., 1970, Solid-State Electronics, V13, P347, DOI 10.1016/0038-1101(70)90185-1
[2]   IMPURITY DISTRIBUTION IN EPITAXIAL GROWTH [J].
GROVE, AS ;
RODER, A ;
SAH, CT .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (3P1) :802-&
[3]   RESISTIVITY OF BULK SILICON AND OF DIFFUSED LAYERS IN SILICON [J].
IRVIN, JC .
BELL SYSTEM TECHNICAL JOURNAL, 1962, 41 (02) :387-+
[4]   SILICON EPITAXIAL WAFER WITH ABRUPT INTERFACE BY 2-STEP EPITAXIAL-GROWTH TECHNIQUE [J].
ISHII, T ;
KONDO, A ;
SHIRAHATA, K .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1975, 122 (11) :1523-1531
[5]   TRANSIENTS IN THE DEPOSITION OF SILICON EPITAXIAL-FILMS IN A CVD-REACTOR [J].
REIF, R ;
VANZI, M .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1981, 128 (10) :2187-2193
[6]   AUTODOPING EFFECTS IN SILICON EPITAXY [J].
SRINIVASAN, GR .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (06) :1334-1342