SINGLE EVENT UPSET IN SOS INTEGRATED-CIRCUITS

被引：16

作者：

ROLLINS, JG ^{[1
]}

CHOMA, J ^{[1
]}

KOLASINSKI, WA ^{[1
]}

机构：

[1] UNIV SO CALIF, DEPT ELECT ENGN ELECTROPHYS, LOS ANGELES, CA 90089 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1987年 / 34卷 / 06期

关键词：

D O I：

10.1109/TNS.1987.4337542

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1713 / 1717

页数：5

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[6]

NAGEL LW, 1975, SPICE2 USERS GUIDE

[7]

PINTO MR, 1985, PISCES 2B USERS GUID

[8]

ROLLINS JG, UNPUB IEEE T COMPUTE

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