BEAM TECHNIQUES FOR THE ANALYSIS OF POORLY CONDUCTING MATERIALS

[1] ABROYAN IA, 1963, SOV PHYS-SOL STATE, V4, P1994

[2] EXCITATION OF ELECTRONS IN SOLIDS BY RELATIVELY SLOW ATOMIC PARTICLES [J]. SOVIET PHYSICS USPEKHI-USSR, 1967, 10 (03): : 332 - +

[3] NEGATIVE ION BOMBARDMENT OF INSULATORS TO ALLEVIATE SURFACE CHARGE-UP [J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (08) : 3419 - +

[4] QUANTITATIVE-ANALYSIS OF TRACE AND MAJOR ELEMENTS IN THIN-SECTIONS OF SOILS WITH THE SECONDARY ION-MICROSCOPE (CAMECA) [J]. GEODERMA, 1983, 30 (1-4) : 117 - 134

[5] LOCAL IN-DEPTH ANALYSIS OF CERAMIC MATERIALS BY NEUTRAL BEAM SECONDARY ION MASS-SPECTROMETRY [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1980, 34 (3-4): : 361 - 373

[6] BORCHARDT G, 1981, MIKROCHIM ACTA, V2, P421

[7] ANALYSIS OF POLYMER SURFACES BY SIMS .1. AN INVESTIGATION OF PRACTICAL PROBLEMS [J]. SURFACE AND INTERFACE ANALYSIS, 1982, 4 (03) : 109 - 115

[8] CRAWFORD CA, UNPUB

[9] SECONDARY-ELECTRON EMISSION INDUCED BY 5-30-KEV MONATOMIC IONS STRIKING THIN OXIDE-FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (10) : 4361 - 4370

[10] Goretzki, 1976, GLASTECH BER, V49, P211

[1] ABROYAN IA, 1963, SOV PHYS-SOL STATE, V4, P1994

[2] EXCITATION OF ELECTRONS IN SOLIDS BY RELATIVELY SLOW ATOMIC PARTICLES [J]. SOVIET PHYSICS USPEKHI-USSR, 1967, 10 (03): : 332 - +

[3] NEGATIVE ION BOMBARDMENT OF INSULATORS TO ALLEVIATE SURFACE CHARGE-UP [J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (08) : 3419 - +

[4] QUANTITATIVE-ANALYSIS OF TRACE AND MAJOR ELEMENTS IN THIN-SECTIONS OF SOILS WITH THE SECONDARY ION-MICROSCOPE (CAMECA) [J]. GEODERMA, 1983, 30 (1-4) : 117 - 134

[5] LOCAL IN-DEPTH ANALYSIS OF CERAMIC MATERIALS BY NEUTRAL BEAM SECONDARY ION MASS-SPECTROMETRY [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1980, 34 (3-4): : 361 - 373

[6] BORCHARDT G, 1981, MIKROCHIM ACTA, V2, P421

[7] ANALYSIS OF POLYMER SURFACES BY SIMS .1. AN INVESTIGATION OF PRACTICAL PROBLEMS [J]. SURFACE AND INTERFACE ANALYSIS, 1982, 4 (03) : 109 - 115

[8] CRAWFORD CA, UNPUB

[9] SECONDARY-ELECTRON EMISSION INDUCED BY 5-30-KEV MONATOMIC IONS STRIKING THIN OXIDE-FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (10) : 4361 - 4370

[10] Goretzki, 1976, GLASTECH BER, V49, P211