BEAM TECHNIQUES FOR THE ANALYSIS OF POORLY CONDUCTING MATERIALS

[21] MCCAUGHAN DV, 1974, CHARACTERIZATION SOL, pCH22

[22] REDHEAD PA, 1968, PHYSICAL BASIS ULTRA

[23] CHARGING EFFECTS IN THE SECONDARY ION MASS-SPECTROMETRIC ANALYSIS OF TARGETS CONTAINING LOW-CONDUCTIVITY REGIONS [J]. JOURNAL OF APPLIED PHYSICS, 1980, 51 (02) : 850 - 855

[24] Smets B.M.J., 1981, VERRES REFRACTARIES, V35, P84

[25] SMETS BMJ, 1981, PHYS CHEM GLASSES, V22, P158

[26] SMETS BMJ, 1982, PHYS CHEM GLASSES, V23, P83

[27] SMETS BMJ, 1983, PHYS CHEM GLASSES, V24, P35

[28] SURFACE-ANALYSIS OF GLASS IN THE ELECTRONICS INDUSTRY [J]. FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1983, 314 (03): : 285 - 288

[29] THE STRUCTURE OF GLASSES AND CRYSTALLINE COMPOUNDS IN THE SYSTEM PBO-SIO2, STUDIED BY X-RAY PHOTO-ELECTRON SPECTROSCOPY [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1982, 48 (2-3) : 423 - 430

[30] STAGG JP, 1977, APPL PHYS LETT, V31, P5326

[21] MCCAUGHAN DV, 1974, CHARACTERIZATION SOL, pCH22

[22] REDHEAD PA, 1968, PHYSICAL BASIS ULTRA

[23] CHARGING EFFECTS IN THE SECONDARY ION MASS-SPECTROMETRIC ANALYSIS OF TARGETS CONTAINING LOW-CONDUCTIVITY REGIONS [J]. JOURNAL OF APPLIED PHYSICS, 1980, 51 (02) : 850 - 855

[24] Smets B.M.J., 1981, VERRES REFRACTARIES, V35, P84

[25] SMETS BMJ, 1981, PHYS CHEM GLASSES, V22, P158

[26] SMETS BMJ, 1982, PHYS CHEM GLASSES, V23, P83

[27] SMETS BMJ, 1983, PHYS CHEM GLASSES, V24, P35

[28] SURFACE-ANALYSIS OF GLASS IN THE ELECTRONICS INDUSTRY [J]. FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1983, 314 (03): : 285 - 288

[29] THE STRUCTURE OF GLASSES AND CRYSTALLINE COMPOUNDS IN THE SYSTEM PBO-SIO2, STUDIED BY X-RAY PHOTO-ELECTRON SPECTROSCOPY [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1982, 48 (2-3) : 423 - 430

[30] STAGG JP, 1977, APPL PHYS LETT, V31, P5326