A STUDY OF THE DEFECT STRUCTURES IN CDTE CRYSTALS USING SYNCHROTRON X-RAY TOPOGRAPHY

被引：22

作者：

LU, YC ^{[1
]}

FEIGELSON, RS ^{[1
]}

ROUTE, RK ^{[1
]}

REK, ZU ^{[1
]}

机构：

[1] STANFORD UNIV,STANFORD LINEAR ACCELERATOR CTR,STANFORD SYNCHROTRON RADIAT,STANFORD,CA 94305

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1986年 / 4卷 / 04期

关键词：

D O I：

10.1116/1.574054

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

收藏

页码：2190 / 2194

页数：5

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