MONOLITHIC SAMPLING HEAD IC

被引:14
作者
MIURA, A [1 ]
YAKIHARA, T [1 ]
UCHIDA, S [1 ]
OKA, S [1 ]
KOBAYASHI, S [1 ]
KAMADA, H [1 ]
DOBASHI, M [1 ]
机构
[1] YOKOGAWA ELECT CORP,DEPT ENGN,DIV ELECTRON DEVICE,MUSASHINO,TOKYO 180,JAPAN
关键词
D O I
10.1109/22.64583
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A monolithic sampling head IC composed of a resonant tunneling diode (RTD) for the sampling pulse generator and Schottky barrier diodes for the sampling bridge has been developed. The RTD was made using an In0.53Ga0.47As/AlAs structure (pseudomorphic strained superlattice) and used as a sampling pulse generator. For this type of high switching voltage RTD, a peak to valley ratio (P/V ratio) of 9 at 202-degrees-C and peak to peak switching voltages of 1.5 V or more at room temperature were achieved. The Schottky barrier diodes were made from an (In0.53Ga0.47As)0.5(In0.52Al0.48As)0.5 compound. A frequency bandwidth of at least 26 GHz was obtained. When attempting to use a quantum effect device such as an RTD in a practical application, the most important factor to consider is its reliability. We achieved good results in an endurance test of this device, in which it was made to continuously oscillate between 600 MHz and 1 GHz at 90-degrees-C for more than 1000 h.
引用
收藏
页码:1980 / 1985
页数:6
相关论文
共 9 条
[1]   OSCILLATIONS UP TO 420 GHZ IN GAAS/ALAS RESONANT TUNNELING DIODES [J].
BROWN, ER ;
SOLLNER, TCLG ;
PARKER, CD ;
GOODHUE, WD ;
CHEN, CL .
APPLIED PHYSICS LETTERS, 1989, 55 (17) :1777-1779
[2]   FABRICATION OF 200-GHZ FMAX RESONANT-TUNNELING DIODES FOR INTEGRATED-CIRCUIT AND MICROWAVE APPLICATIONS [J].
DIAMOND, SK ;
OZBAY, E ;
RODWELL, MJW ;
BLOOM, DM ;
PAO, YC ;
WOLAK, E ;
HARRIS, JS .
IEEE ELECTRON DEVICE LETTERS, 1989, 10 (03) :104-106
[3]   SUPERLATTICE AND NEGATIVE DIFFERENTIAL CONDUCTIVITY IN SEMICONDUCTORS [J].
ESAKI, L ;
TSU, R .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1970, 14 (01) :61-&
[5]   A PSEUDOMORPHIC IN0.53GA0.47AS ALAS RESONANT TUNNELING BARRIER WITH A PEAK-TO-VALLEY CURRENT RATIO OF 14 AT ROOM-TEMPERATURE [J].
INATA, T ;
MUTO, S ;
NAKATA, Y ;
SASA, S ;
FUJII, T ;
HIYAMIZU, S .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1987, 26 (08) :L1332-L1334
[6]   CONTINUOUS 300-K LASER OPERATION OF STRAINED SUPER-LATTICES [J].
LUDOWISE, MJ ;
DIETZE, WT ;
LEWIS, CR ;
CAMRAS, MD ;
HOLONYAK, N ;
FULLER, BK ;
NIXON, MA .
APPLIED PHYSICS LETTERS, 1983, 42 (06) :487-489
[7]   PICOSECOND CHARACTERIZATION OF INGAAS/INALAS RESONANT TUNNELING BARRIER DIODE BY ELECTRO-OPTIC SAMPLING [J].
TACKEUCHI, A ;
INATA, T ;
MUTO, S ;
MIYAUCHI, E .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1989, 28 (05) :L750-L753
[8]   TUNNELING IN A FINITE SUPERLATTICE [J].
TSU, R ;
ESAKI, L .
APPLIED PHYSICS LETTERS, 1973, 22 (11) :562-564
[9]   DETERMINATION OF THRESHOLD FAILURE LEVELS OF SEMICONDUCTOR DIODES AND TRANSISTORS DUE TO PULSE VOLTAGES [J].
WUNSCH, DC ;
BELL, RR .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1968, NS15 (06) :244-+