HCL AQUEOUS-SOLUTION DILUTED WITH METHANOL AS AN ELECTROLYTE FOR C-V PROFILINGS OF GAAS AND INP

被引:5
作者
AKITA, K
SUGIMOTO, Y
KAWANISHI, H
机构
[1] Optoelectronics Technology Research Laboratory, Tsukuba, 30-26, 5–5, Tohkodai
关键词
D O I
10.1149/1.2085931
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
C-V profiling and net dopant concentration measurement using "Post Office Profile Plotter" have been widely carried out for GaAs and other III-V compound semiconductor materials (1-3). The electrolyte is selected for the material to form an electrical contact to the semiconductor and to react with the semiconductor to remove a given thickness of material per unit charge passed. Tiron electrolyte (2) and a solution of sodium hydroxide (NaOH) and disodium ethylenediamine tetraacetate (4) are used for GaAs and AlGaAs. In this note, a simple electrolyte of hydrochloric acid (HCl) aqueous solution diluted with methanol is presented to be useful for GaAs, AlGaAs, and InP. The electrolyte is especially effective for p+-GaAs, where the tiron electrolyte often encountered soft breakdown.
引用
收藏
页码:2095 / 2097
页数:3
相关论文
共 7 条
[1]   PHOTOLUMINESCENCE INTENSITIES FROM GAAS IMMERSED IN HCL AQUEOUS-SOLUTIONS DILUTED WITH ORGANIC-SOLVENTS [J].
AKITA, K ;
TANEYA, M ;
SUGIMOTO, Y ;
HIDAKA, H .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1990, 137 (07) :2081-2083
[2]   AUTOMATIC CARRIER CONCENTRATION PROFILE PLOTTER USING AN ELECTROCHEMICAL TECHNIQUE [J].
AMBRIDGE, T ;
FAKTOR, MM .
JOURNAL OF APPLIED ELECTROCHEMISTRY, 1975, 5 (04) :319-328
[3]   AUTOMATIC ELECTROCHEMICAL PROFILING OF CARRIER CONCENTRATION IN INDIUM-PHOSPHIDE [J].
AMBRIDGE, T ;
ASHEN, DJ .
ELECTRONICS LETTERS, 1979, 15 (20) :647-648
[4]   APPLICATIONS OF ELECTROCHEMICAL METHODS FOR SEMICONDUCTOR CHARACTERIZATION .1. HIGHLY REPRODUCIBLE CARRIER CONCENTRATION PROFILING OF VPE''HI-LO'' NORMAL-GAAS [J].
AMBRIDGE, T ;
STEVENSON, JL ;
REDSTALL, RM .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (01) :222-228
[5]  
CABANISS G, INSTRUCTION MANUAL P, P13
[6]   AN IMPROVED METHOD FOR THE ELECTROCHEMICAL C-V PROFILING OF INDIUM-PHOSPHIDE [J].
GREEN, RT ;
WALKER, DK ;
WOLFE, CM .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1986, 133 (11) :2278-2283
[7]   DEGRADATION OF PHOTOLUMINESCENCE INTENSITY CAUSED BY EXCITATION-ENHANCED OXIDATION OF GAAS SURFACES [J].
SUZUKI, T ;
OGAWA, M .
APPLIED PHYSICS LETTERS, 1977, 31 (07) :473-475