PHOTOEMISSION-BASED PHOTOVOLTAGE PROBE OF SEMICONDUCTOR SURFACE AND INTERFACE ELECTRONIC-STRUCTURE

被引:156
作者
DEMUTH, JE
THOMPSON, WJ
DINARDO, NJ
IMBIHL, R
机构
关键词
D O I
10.1103/PhysRevLett.56.1408
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
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页码:1408 / 1411
页数:4
相关论文
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