INSITU OBSERVATION BY X-RAY SYNCHROTRON TOPOGRAPHY OF THE GROWTH OF PLASTICALLY DEFORMED REGIONS AROUND CRACK TIPS IN SILICON UNDER CREEP CONDITIONS

被引：20

作者：

MICHOT, G ^{[1
]}

GEORGE, A ^{[1
]}

机构：

[1] UNIV PARIS 11,LURE,BATIMENT 209C,F-91405 ORSAY,FRANCE

来源：

SCRIPTA METALLURGICA | 1982年 / 16卷 / 05期

关键词：

D O I：

10.1016/0036-9748(82)90262-9

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

引用

页码：519 / 524

页数：6

共 7 条

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[2] GEORGE A, UNPUB J APPL CRYST
[3] MICHOT G, 1980, PHILOS MAG A, V42, P195, DOI 10.1080/01418618009365810
[4] MICHOT G, UNPUB
[5] X-RAY TOPOGRAPHY AND DYNAMICS - DESCRIPTION OF 2 EXPERIMENTS PERFORMED AT LURE DCI
MILTAT, J
[J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 152 (01): : 323 - 329
[6] X-RAY TOPOGRAPHY SETTINGS - WHITE BEAM TOPOGRAPHY AND DIRECT VIEWING DETECTORS, 2-AXIS SPECTROMETER
SAUVAGE, M
[J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 152 (01): : 313 - 317
[7] STJOHN C, 1975, PHILOS MAG, V32, P1193, DOI 10.1080/14786437508228099