THICKNESS DEPENDENCE OF TRANSPORT-PROPERTIES OF DOPED POLYCRYSTALLINE TIN OXIDE-FILMS

被引:100
作者
BELANGER, D
DODELET, JP
LOMBOS, BA
DICKSON, JI
机构
[1] CONCORDIA UNIV, MONTREAL H3G 1M8, QUEBEC, CANADA
[2] ECOLE POLYTECH, MONTREAL H3C 3A7, QUEBEC, CANADA
关键词
D O I
10.1149/1.2114132
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:1398 / 1405
页数:8
相关论文
共 40 条
[1]   TRANSPORT PROPERTIES OF POLYCRYSTALLINE SILICON FILMS [J].
BACCARANI, G ;
RICCO, B ;
SPADINI, G .
JOURNAL OF APPLIED PHYSICS, 1978, 49 (11) :5565-5570
[2]   PREPARATION AND PROPERTIES OF SI/SNO2 HETEROJUNCTIONS [J].
BADAWY, W ;
DECKER, F ;
DOBLHOFER, K .
SOLAR ENERGY MATERIALS, 1983, 8 (04) :363-369
[3]  
BELANGER D, 1983, J CAN CERAM SOC, V52, P28
[4]   PHOTOELECTROCHEMICAL CHARACTERISTICS AND BEHAVIOR OF A SURFACTANT ALUMINUM PHTHALOCYANINE CELL [J].
BELANGER, D ;
DODELET, JP ;
DAO, LH .
JOURNAL OF PHYSICAL CHEMISTRY, 1984, 88 (19) :4288-4295
[5]   SB-121 MOSSBAUER STUDY OF THE EFFECTS OF CALCINATION ON THE STRUCTURE OF TIN-ANTIMONY OXIDES [J].
BERRY, FJ ;
LAUNDY, BJ .
JOURNAL OF THE CHEMICAL SOCIETY-DALTON TRANSACTIONS, 1981, (06) :1442-1444
[6]  
BOST MC, 1982, ELECTROCHEMICAL SOC, P411
[7]   TRANSPARENT CONDUCTORS - A STATUS REVIEW [J].
CHOPRA, KL ;
MAJOR, S ;
PANDYA, DK .
THIN SOLID FILMS, 1983, 102 (01) :1-46
[8]   CHEMICAL VAPOR DEPOSITED POLYCRYSTALLINE SILICON. [J].
Cowher, M.E. ;
Sedgwick, T.O. .
1600, (119)
[9]   SURFACE-PROPERTIES OF ANTIMONY DOPED TIN(IV) OXIDE - A STUDY BY ELECTRON-SPECTROSCOPY [J].
COX, PA ;
EGDELL, RG ;
HARDING, C ;
PATTERSON, WR ;
TAVENER, PJ .
SURFACE SCIENCE, 1982, 123 (2-3) :179-203
[10]  
DECKER F, 1982, ISRAEL J CHEM, V22, P195