DOUBLE DETECTION MICROSCOPE - STOM-AFM, PRINCIPLE AND RESULTS

Near field optical microscopy provides a high resolved map of the light intensity very close to the object surface. This intensity is directly correlated with the profile and with the physicochemical nature of the material constituting the object. A hybrid microscope has been built to partially decorrelate these data. It combines an AFM (Atomic Force Microscopy) detection with a STOM (Scanning Tunneling Optical Microscopy) detection. The information can be obtained simultaneously or sequentially on the same scanned area. After a technical description of the realized device, we will conclude by presenting the first results.