ORGANIC SECONDARY ION MASS-SPECTROMETRY (SIMS) AND ITS RELATION TO FAST ATOM BOMBARDMENT (FAB)

被引：26

作者：

BENNINGHOVEN, A

机构：

来源：

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1983年 / 46卷 / JAN期

关键词：

D O I：

10.1016/0020-7381(83)80151-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

引用

页码：459 / 462

页数：4

共 17 条

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