ELECTROMIGRATION DETECTION BY MEANS OF LOW-FREQUENCY NOISE MEASUREMENTS IN THIN-FILM INTERCONNECTIONS

被引：35

作者：

DILIGENTI, A

NERI, B

BAGNOLI, PE

BARSANTI, A

RIZZO, M

机构：

来源：

关键词：

D O I：

10.1109/EDL.1985.26247

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：606 / 608

页数：3

共 8 条

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