THERMAL-DESORPTION SPECTROSCOPY STUDY OF HF/DF-TREATED SI(100) SURFACES

被引:9
作者
KINOSHITA, K
NISHIYAMA, I
机构
[1] LSI Basic Research Laboratory, Microelectronics Research Laboratories, NEC Corporation, Tsukuba
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1995年 / 13卷 / 06期
关键词
D O I
10.1116/1.579472
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Hydrogen (H)- and deuterium (D)-terminated Si (100) surfaces are investigated by thermal desorption spectroscopy (TDS). The H/D exchange reaction, using 1.6% DE creates partially D-terminated Si surfaces from passively H-terminated Si by using 1.6% or 49% HE The H/D exchange reaction rate, determined from TDS intensity changes, follows natural-logarithmic equations. The half-exchange time is 12.8 min. The 49% HF pretreated samples show rapid surface roughness changes in the initial stage of the 1.6% DF treatment; these changes are detected by rapid TDS H-2 intensity decreases. SiFx and F-2 peaks are detected by TDS. F/D exchange occurs on the 49% HF pretreated samples along with H/D exchange. The activation energy for deuterium termination is 8.7 kcal/mol. (C) 1995 American Vacuum Society.
引用
收藏
页码:2709 / 2714
页数:6
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