EFFECTS OF INTERFACE STRUCTURE ON THE ELECTRICAL CHARACTERISTICS OF PTSI-SI SCHOTTKY-BARRIER CONTACTS

被引：7

作者：

TSAUR, BY

SILVERSMITH, DJ

MOUNTAIN, RW

ANDERSON, CH

机构：

来源：

THIN SOLID FILMS | 1982年 / 93卷 / 3-4期

关键词：

D O I：

10.1016/0040-6090(82)90139-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：331 / 340

页数：10

共 10 条

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[7]

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