FACTORS AFFECTING PRECISION AND ACCURACY IN QUANTITATIVE-ANALYSIS BY SECONDARY ION MASS-SPECTROMETRY

被引：24

作者：

DENG, RC ^{[1
]}

WILLIAMS, P ^{[1
]}

机构：

[1] ARIZONA STATE UNIV,DEPT CHEM,TEMPE,AZ 85287

来源：

关键词：

D O I：

10.1021/ac00192a035

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1946 / 1948

页数：3

共 5 条

LETA, DP ;

MORRISON, GH .

[2]

SLODZIAN G, 1975, SURF SCI, V48, P1610

[3] ION-STIMULATED DESORPTION OF POSITIVE HALOGEN IONS [J].

WILLIAMS, P .

PHYSICAL REVIEW B, 1981, 23 (11) :6187-6190

WILLIAMS, P ;

BAKER, JE ;

DAVIES, JA ;

JACKMAN, TE .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1981, 191 (1-3) :318-322

[5] IONIZATION MECHANISM OF H+ SPUTTERED FROM HYDROGENATED SILICON [J].

WITTMAACK, K .