DOPING OF EPITAXIAL SILICON - BEHAVIOR OF SOLID SOLUTIONS

被引:10
作者
RAICHOUDHURY, P
机构
[1] Metallurgical and Materials Engineering Department, University of Pittsburgh, Pittsburgh
关键词
D O I
10.1016/0022-3697(69)90249-2
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
This paper presents a theoretical model for the behavior of solid solutions of group III and V impurities in silicon. The impurities are considered as weak electrolytes dissolved in an ionizing medium. The Fermi level, the activity coefficient and the dissociation equilibrium constants for the dopants are calculated, using Fermi-Dirac statistics, as functions of temperature and doping level. The solid solutions obey Henry's law at very low concentrations and exhibit positive deviations as the concentration is increased. Ionization of impurities or dopants as a function of their concentrations are discussed. © 1969.
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页码:1811 / +
页数:1
相关论文
共 11 条
[1]   SEMICONDUCTOR-TO-METAL TRANSITION IN N-TYPE SILICON [J].
ALEXANDER, MN ;
HOLCOMB, DF .
SOLID STATE COMMUNICATIONS, 1968, 6 (06) :355-+
[2]  
BANER FL, 1961, COMM ACM, V4
[3]  
Bardeen J., 1951, Atom Movements, P87
[5]   FINE STRUCTURE IN THE ABSORPTION-EDGE SPECTRUM OF SI [J].
MACFARLANE, GG ;
MCLEAN, TP ;
QUARRINGTON, JE ;
ROBERTS, V .
PHYSICAL REVIEW, 1958, 111 (05) :1245-1254
[6]   DIFFUSION OF PHOSPHORUS INTO SILICON [J].
MAEKAWA, S .
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1962, 17 (10) :1592-&
[7]  
McDougall J., 1938, Philos. Trans. R. Soc. A, V237, P67, DOI DOI 10.1098/RSTA.1938.0004
[8]  
RALSTON A, 1967, ADVANCES NUMERICA ED, V2, pCH6
[9]   CHEMICAL EFFECTS DUE TO THE IONIZATION OF IMPURITIES IN SEMICONDUCTORS [J].
REISS, H .
JOURNAL OF CHEMICAL PHYSICS, 1953, 21 (07) :1209-1217
[10]  
Wagner C, 1933, Z PHYS CHEM B-CHEM E, V21, P25