IONIZATION ENERGIES IN CDXHG1-XTE AVALANCHE PHOTODIODES

被引:45
作者
LEVEQUE, G
NASSER, M
BERTHO, D
ORSAL, B
ALABEDRA, R
机构
[1] UNIV MONTPELLIER 2,GES,F-34095 MONTPELLIER 5,FRANCE
[2] UNIV MONTPELLIER 2,CEM,F-34095 MONTPELLIER 5,FRANCE
关键词
D O I
10.1088/0268-1242/8/7/021
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The CdxHg1-xTe avalanche photodiodes present hole or electron majority multiplication, depending on the x values, with a ratio of ionization factors k = alpha(h)/alpha(e) maximum for x = 0.6 and minimum for x = 0.4. This behaviour is explained by a simulation of the multiplication phenomenon. Monte Carlo electron trajectories are averaged to obtain ionization factors alpha(h) and alpha(e). This model introduces a linear relationship between the logarithm of k and the ionization energy difference for holes and electrons: DELTAE(i) = E(ih) - E(ie). We compute this energy difference in an empirical tight binding band structure and show that its variation versus x agrees with experimental k(x) variations. The hole multiplication maximum at x = 0.6 is explained as the effect of transitions issued from the split-off band at GAMMA.
引用
收藏
页码:1317 / 1323
页数:7
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