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METHOD FOR CALCULATING INDEX OF REFRACTION OF THIN-FILMS
被引:8
作者
:
WOHLGEMUTH, JH
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV WATERLOO, DEPT PHYS, WATERLOO N2L 3G1, ONTARIO, CANADA
UNIV WATERLOO, DEPT PHYS, WATERLOO N2L 3G1, ONTARIO, CANADA
WOHLGEMUTH, JH
[
1
]
BRODIE, DE
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV WATERLOO, DEPT PHYS, WATERLOO N2L 3G1, ONTARIO, CANADA
UNIV WATERLOO, DEPT PHYS, WATERLOO N2L 3G1, ONTARIO, CANADA
BRODIE, DE
[
1
]
机构
:
[1]
UNIV WATERLOO, DEPT PHYS, WATERLOO N2L 3G1, ONTARIO, CANADA
来源
:
CANADIAN JOURNAL OF PHYSICS
|
1975年
/ 53卷
/ 18期
关键词
:
D O I
:
10.1139/p75-222
中图分类号
:
O4 [物理学];
学科分类号
:
0702 ;
摘要
:
引用
收藏
页码:1737 / 1742
页数:6
相关论文
共 13 条
[11]
OPTICAL CONSTANTS BY REFLECTION
ROBINSON, TS
论文数:
0
引用数:
0
h-index:
0
ROBINSON, TS
[J].
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B,
1952,
65
(395):
: 910
-
911
[12]
SPECTROSCOPY IN INFRARED BY REFLECTION AND ITS USE FOR HIGHLY ABSORBING SUBSTANCES
SIMON, I
论文数:
0
引用数:
0
h-index:
0
SIMON, I
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1951,
41
(05)
: 336
-
345
[13]
DETERMINATION OF OPTICAL CONSTANTS FROM REFLECTANCE OR TRANSMITTANCE MEASUREMENTS ON BULK CRYSTALS OR THIN FILMS
VERLEUR, HW
论文数:
0
引用数:
0
h-index:
0
VERLEUR, HW
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1968,
58
(10)
: 1356
-
&
←
1
2
→
共 13 条
[11]
OPTICAL CONSTANTS BY REFLECTION
ROBINSON, TS
论文数:
0
引用数:
0
h-index:
0
ROBINSON, TS
[J].
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B,
1952,
65
(395):
: 910
-
911
[12]
SPECTROSCOPY IN INFRARED BY REFLECTION AND ITS USE FOR HIGHLY ABSORBING SUBSTANCES
SIMON, I
论文数:
0
引用数:
0
h-index:
0
SIMON, I
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1951,
41
(05)
: 336
-
345
[13]
DETERMINATION OF OPTICAL CONSTANTS FROM REFLECTANCE OR TRANSMITTANCE MEASUREMENTS ON BULK CRYSTALS OR THIN FILMS
VERLEUR, HW
论文数:
0
引用数:
0
h-index:
0
VERLEUR, HW
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1968,
58
(10)
: 1356
-
&
←
1
2
→