THRESHOLD CURRENT-DENSITY CALCULATIONS FOR FAR-INFRARED SEMICONDUCTOR-LASERS

被引:16
作者
YEE, WM
SHORE, KA
机构
[1] Sch. of Electron. and Electr. Eng., Bath Univ.
关键词
D O I
10.1088/0268-1242/9/6/005
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We study theoretically the conditions for achieving lasing action at infrared and far-infrared wavelengths based on intersubband transitions in semiconductor quantum well structures, taking into account resonant tunnelling and intersubband absorption-emission processes. Analysis of optical losses in the semiconductor quantum well structures reveals that a reasonably low threshold current density in the range of 1-5 kA cm-2 is achievable for room temperature lasing at emission wavelength of lambda = 60 mum. A significantly higher threshold current density of 40-50 kA cm-2 is required for lasing at lambda = 10 mum.
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页码:1190 / 1197
页数:8
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