ATOMIC-FORCE MICROSCOPY PROBE TIP VISUALIZATION AND IMPROVEMENT OF IMAGES USING A SIMPLE DECONVOLUTION PROCEDURE

被引：201

作者：

MARKIEWICZ, P ^{[1
]}

GOH, MC ^{[1
]}

机构：

[1] UNIV TORONTO,DEPT CHEM,TORONTO M5S 1A1,ON,CANADA

来源：

LANGMUIR | 1994年 / 10卷 / 01期

关键词：

D O I：

10.1021/la00013a002

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A simple numerical procedure for separating the probe tip from images obtained by atom;e force microscopy (AFM) is presented. The importance of this is 2-fold: first, it provides a way of visualizing the probe tip in a nondestructive manner, which is useful in eliminating artifacts; second, it enables the deconvolution of the probe tip from the image, resulting in a more accurate picture of the sample. Examples of deconvolution using both an idealized tip and a real tip are given. Such a quick and effective procedure enables incorporating the visualization of AFM tips as a daily routine.

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页码：5 / 7

页数：3

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