ATOMICALLY FLAT LPE-GROWN FACETS SEEN BY SCANNING TUNNELING MICROSCOPY

被引:24
作者
SCHEEL, HJ
BINNIG, G
ROHRER, H
机构
关键词
D O I
10.1016/0022-0248(82)90200-7
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
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页码:199 / 202
页数:4
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共 16 条
[1]   MEASUREMENT OF RMS ROUGHNESS, AUTOCOVARIANCE FUNCTION AND OTHER STATISTICAL PROPERTIES OF OPTICAL SURFACES USING A FECO SCANNING INTERFEROMETER [J].
BENNETT, JM .
APPLIED OPTICS, 1976, 15 (11) :2705-2721
[2]   TUNNELING THROUGH A CONTROLLABLE VACUUM GAP [J].
BINNIG, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
APPLIED PHYSICS LETTERS, 1982, 40 (02) :178-180
[3]  
BINNIG G, 1982, PHYS REV LETT, V39, P57
[4]   THE GROWTH OF CRYSTALS AND THE EQUILIBRIUM STRUCTURE OF THEIR SURFACES [J].
BURTON, WK ;
CABRERA, N ;
FRANK, FC .
PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1951, 243 (866) :299-358
[5]  
GILMER GH, 1977, 1976 CRYSTAL GROWTH, P79
[6]   FILM THICKNESS MEASUREMENT BY ABSOLUTE METHODS [J].
GREAVES, C .
VACUUM, 1970, 20 (10) :437-&
[7]  
KOMATSU H, 1975, CRYSTAL GROWTH CHARA, P333
[8]  
KROHN M, 1977, 1976 CRYSTAL GROWTH, P141
[9]  
MULLERKRUMBHAAR H, 1977, 1976 CRYSTAL GROWTH, P115
[10]   TRANSITION TO FACETING IN MULTILAYER LIQUID-PHASE EPITAXY OF GAAS [J].
SCHEEL, HJ .
APPLIED PHYSICS LETTERS, 1980, 37 (01) :70-73