ON THE RELIABILITY OF 1.3-MU-M INGAASP/INP EDGE-EMITTING LEDS FOR OPTICAL-FIBER COMMUNICATION

被引：5

作者：

ETTENBERG, M ^{[1
]}

OLSEN, GH ^{[1
]}

HAWRYLO, FZ ^{[1
]}

机构：

[1] RCA LABS, PRINCETON, NJ 08540 USA

来源：

JOURNAL OF LIGHTWAVE TECHNOLOGY | 1984年 / 2卷 / 06期

关键词：

D O I：

10.1109/JLT.1984.1073711

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1016 / 1023

页数：8

共 15 条

[11] RECENT ADVANCES IN THE PERFORMANCE AND RELIABILITY OF INGAASP LEDS FOR LIGHTWAVE COMMUNICATION-SYSTEMS [J].

SAUL, RH .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1983, 30 (04) :285-295

[12] PERFORMANCE AND RELIABILITY OF HIGH RADIANCE INGAASP INP DH LEDS OPERATING IN THE 1.15-1.5 MU-M WAVELENGTH REGION [J].

WADA, O ;

YAMAKOSHI, S ;

HAMAGUCHI, H ;

SANADA, T ;

NISHITANI, Y ;

SAKURAI, T .

IEEE JOURNAL OF QUANTUM ELECTRONICS, 1982, 18 (03) :368-374

[13] RELIABILITY OF HIGH RADIANCE INGAASP-INP LEDS OPERATING IN THE 1.2-1.3 MU-M WAVELENGTH [J].

YAMAKOSHI, S ;

ABE, M ;

WADA, O ;

KOMIYA, S ;

SAKURAI, T .

IEEE JOURNAL OF QUANTUM ELECTRONICS, 1981, 17 (02) :167-173

[14] PERFORMANCE-CHARACTERISTICS AND EXTENDED LIFETIME DATA FOR INGAASP-INP LEDS [J].

YEATS, R ;

CHAI, YG ;

GIBBS, TD ;

ANTYPAS, GA .

ELECTRON DEVICE LETTERS, 1981, 2 (09) :234-236

[15] RELIABILITY OF INGAASP LIGHT-EMITTING-DIODES AT HIGH-CURRENT DENSITY [J].

ZIPFEL, CL ;

CHIN, AK ;

DIGIUSEPPE, MA .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1983, 30 (04) :310-316

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