IMPROVED HIGH-RESOLUTION IMAGE-PROCESSING OF BRIGHT FIELD ELECTRON-MICROGRAPHS .2. EXPERIMENT

被引：64

作者：

KIRKLAND, EJ ^{[1
]}

SIEGEL, BM ^{[1
]}

UYEDA, N ^{[1
]}

FUJIYOSHI, Y ^{[1
]}

机构：

[1] KYOTO UNIV,INST CHEM RES,UJI,KYOTO 611,JAPAN

来源：

关键词：

D O I：

10.1016/0304-3991(85)90002-6

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：87 / 103

页数：17

共 26 条

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