共 25 条
- [2] MEASUREMENT OF SURFACE-DEFECTS BY LOW-ENERGY ELECTRON-DIFFRACTION [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1984, 34 (04): : 205 - 214
- [4] HIGH-RESOLUTION MEASUREMENT OF THE STEP DISTRIBUTION AT THE SI/SIO2 INTERFACE [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1984, 2 (03): : 346 - 348
- [6] LEED STUDIES OF SURFACE IMPERFECTIONS [J]. APPLICATIONS OF SURFACE SCIENCE, 1982, 11-2 (JUL): : 450 - 469
- [7] HENZLER M, 1977, TOPICS CURRENT PHYSI, V4