SELF-HEALING PROCESS AND DC BREAKDOWN IN THERMALLY GROWN STEARIC-ACID THIN-FILMS

被引:1
作者
AGARWAL, VK
HUANG, CH
机构
[1] Texas Tech Univ, Lubbock, TX, USA, Texas Tech Univ, Lubbock, TX, USA
关键词
ELECTRIC BREAKDOWN;
D O I
10.1016/0040-6090(86)90015-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper recent work on dc breakdown field strengths of stearic acid thin films prepared by thermal evaporation in vacuum is described. Since these vacuum-deposited films contained a relatively high density of weak spots, voids and/or inhomogeneities, their breakdown strengths were at least an order of magnitude lower than those of the corresponding specimens prepared by the dipping technique. Therefore, the specimens were first allowed to undergo a 'self-healing' process which resulted in an increase in the sample resistance and an improved breakdown strength. The nature of the self-healing process is qualitatively discussed considering some chemical changes and/or melting of the film between the electrodes. Further, the authors discuss two types of breakdowns, single hole and self-propagating, observed in vacuum-evaporated films. The voltage-time and voltage-current characteristics and micrographs of breakdowns in these films are illustrated. The breakdown process is believed to be an electronic-modified thermal event.
引用
收藏
页码:153 / 160
页数:8
相关论文
共 21 条
[1]  
Agarwal V. K., 1975, Electrocomponent Science and Technology, V2, P75, DOI 10.1155/APEC.2.75a
[2]  
Agarwal V. K., 1974, Electrocomponent Science and Technology, V1, P87, DOI 10.1155/APEC.1.87
[3]  
Agarwal V. K., 1975, Electrocomponent Science and Technology, V2, P1, DOI 10.1155/APEC.2.1
[4]  
AGARWAL VK, 1976, JPN J APPL PHYS, V15, P2327, DOI 10.1143/JJAP.15.2327
[5]   THICKNESS DEPENDENCE OF BREAKDOWN FIELD IN THIN FILMS [J].
AGARWAL, VK ;
SRIVASTAVA, VK .
THIN SOLID FILMS, 1971, 8 (05) :377-+
[6]   THICKNESS DEPENDENT STUDIES OF DIELECTRIC BREAKDOWN IN LANGMUIR THIN MOLECULAR FILMS [J].
AGARWAL, VK ;
SRIVASTA.VK .
SOLID STATE COMMUNICATIONS, 1973, 12 (09) :829-834
[7]   THICKNESS DEPENDENCE OF BREAKDOWN FIELD [J].
AGARWAL, VK ;
SRIVASTA.VK .
THIN SOLID FILMS, 1972, 13 (02) :S23-S24
[8]   AC BREAKDOWN STUDIES OF BUILT-UP BARIUM STEARATE FILMS [J].
AGARWAL, VK ;
SRIVASTAVA, VK .
JOURNAL OF APPLIED PHYSICS, 1973, 44 (06) :2900-2901
[9]   HIGH-FREQUENCY DIELECTRIC-CONSTANT OF EVAPORATED FATTY-ACID FILMS [J].
AGARWAL, VK .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1977, 10 (06) :919-923
[10]   EVAPORATED-FILMS OF STEARIC ACID STUDIED BY X-RAY-DIFFRACTION [J].
AGARWAL, VK ;
IGASAKI, Y ;
MITSUHASHI, H .
THIN SOLID FILMS, 1976, 33 (03) :L31-L35