A METHOD FOR THE CALCULATION OF LEED ANGULAR PROFILES TO ESTIMATE OVERLAYER SPACINGS AND ISLAND SIZE DISTRIBUTIONS

被引:14
作者
SALONER, D [1 ]
LAGALLY, MG [1 ]
机构
[1] UNIV WISCONSIN,CTR MAT SCI,MADISON,WI 53706
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1984年 / 2卷 / 02期
关键词
D O I
10.1116/1.572485
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:935 / 938
页数:4
相关论文
共 28 条
  • [1] CLEARFIELD HM, UNPUB
  • [2] CLEARFIELD HM, THESIS
  • [3] THE ATOMIC GEOMETRY OF GAAS(110) REVISITED
    DUKE, CB
    RICHARDSON, SL
    PATON, A
    KAHN, A
    [J]. SURFACE SCIENCE, 1983, 127 (02) : L135 - L143
  • [4] Fink M, 1972, ATOM DATA, V4, P129
  • [5] Gregory D., 1974, Atomic Data and Nuclear Data Tables, V14, P39, DOI 10.1016/S0092-640X(74)80029-X
  • [6] EPITAXY OF SI(111) AS STUDIED WITH A NEW HIGH RESOLVING LEED SYSTEM
    GRONWALD, KD
    HENZLER, M
    [J]. SURFACE SCIENCE, 1982, 117 (1-3) : 180 - 187
  • [7] HAHN PO, 1981, J APPL PHYS, V51, P2079
  • [8] QUANTITATIVE-EVALUATION OF RANDOM DISTRIBUTED STEPS AT INTERFACES AND SURFACES
    HENZLER, M
    [J]. SURFACE SCIENCE, 1978, 73 (01) : 240 - 251
  • [9] HENZLER M, 1977, TOPICS CURRENT PHYSI, V4
  • [10] LEED FROM STATISTICAL STEP MODELS
    HOUSTON, JE
    PARK, RL
    [J]. SURFACE SCIENCE, 1971, 26 (01) : 269 - &