CORRELATION BETWEEN ELECTRON-SPIN RESONANCE, ELECTRICAL-CONDUCTIVITY AND OPTICAL-ABSORPTION EDGE OF CO-EVAPORATED THIN-FILMS OF THE DIELECTRIC SYSTEM SIO/V2O5

被引：9

作者：

ALRAMADHAN, FAS

ARSHAK, KI

HOGARTH, CA

机构：

来源：

JOURNAL OF MATERIALS SCIENCE | 1984年 / 19卷 / 11期

关键词：

D O I：

10.1007/BF02396941

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：3687 / 3691

页数：5

共 17 条

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[7]

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