SURFACE-ROUGHNESS AND GRAIN-BOUNDARY EFFECTS ON THE OPTICAL-PROPERTIES OF LOW-PRESSURE CHEMICAL-VAPOR-DEPOSITED SILICON THIN-FILMS BY SPECTROSCOPIC ELLIPSOMETRY

被引:55
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LOGOTHETIDIS, S
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10.1063/1.343401
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O59 [应用物理学];
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页码:2416 / 2426
页数:11
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