A MULTI-ELEMENT SILICON DETECTOR FOR X-RAY FLUX MEASUREMENTS

被引:15
作者
THOMPSON, AC [1 ]
GOULDING, FS [1 ]
SOMMER, HA [1 ]
WALTON, JT [1 ]
HUGHES, EB [1 ]
ROLFE, J [1 ]
ZEMAN, HD [1 ]
机构
[1] STANFORD UNIV, HANSEN PHYS LAB, STANFORD, CA 94305 USA
关键词
D O I
10.1109/TNS.1982.4335961
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:793 / 797
页数:5
相关论文
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KOCHE A, 1968, SEMICONDUCTOR DETECT, pCH2
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THOMPSON AC, 1981, 2ND P NAT C SYNCHR R
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ZEMAN HD, 1982, IEEE T NUCL SCI, V29, P442