DIRECT CORRELATION OF ION AND ELECTRON-MICROSCOPIC IMAGES BY DIGITAL IMAGE SUPERPOSITIONING

被引：10

作者：

TURNER, LK ^{[1
]}

LING, YC ^{[1
]}

BERNIUS, MT ^{[1
]}

MORRISON, GH ^{[1
]}

机构：

[1] CORNELL UNIV,BAKER LAB CHEM,ITHACA,NY 14853

来源：

ANALYTICAL CHEMISTRY | 1987年 / 59卷 / 20期

关键词：

D O I：

10.1021/ac00147a005

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：2463 / 2468

页数：6

共 12 条

[1] DARK-FIELD STIGMATIC ION MICROSCOPY FOR STRUCTURAL CONTRAST ENHANCEMENT [J].

BERNIUS, MT ;

LING, YC ;

MORRISON, GH .

JOURNAL OF APPLIED PHYSICS, 1986, 59 (10) :3332-3338

[2] ELIMINATION OF RESIDUAL IMAGE DISTORTION IN THE STIGMATIC ION-MICROSCOPE [J].

BERNIUS, MT ;

LING, YC ;

MORRISON, GH .

JOURNAL OF APPLIED PHYSICS, 1987, 61 (05) :1677-1681

[3]

BRIGHT DS, 1984, MICROBEAM ANAL 1984, P173

[4]

CASTLEMAN KR, 1979, DIGITAL IMAGE PROCES, pCH8

[5] CORRELATIVE LIGHT, ELECTRON, AND ION MICROSCOPY ON A SINGLE HISTOLOGIC SECTION [J].

KUPKE, KG ;

PICKETT, JP ;

INGRAM, P ;

GRIFFIS, DP ;

LINTON, RW ;

SHELBURNE, JD .

JOURNAL OF MICROSCOPY-OXFORD, 1983, 131 (JUL) :RP1-RP2

[6]

LING YC, 1987, J CHEM INF COMP SCI, V24, P86

[7]

NEWBURY DE, 1986, 34TH ANN C MASS SPEC

[8] DIFFERENTIAL SPUTTERING CORRECTION FOR ION MICROSCOPY WITH IMAGE DEPTH PROFILING [J].

PATKIN, AJ ;

CHANDRA, S ;

MORRISON, GH .

ANALYTICAL CHEMISTRY, 1982, 54 (14) :2507-2510

[9] DIGITAL IMAGE MOTION CORRECTION BY SPATIAL WARP METHODS [J].

PICKENS, DR ;

PRICE, RR ;

ERICKSON, JJ ;

JAMES, AE .

MEDICAL PHYSICS, 1987, 14 (01) :56-61

[10] A SIMPLE METHOD FOR CORRELATIVE LIGHT, SCANNING ELECTRON-MICROSCOPIC AND X-RAY MICROANALYTICAL EXAMINATION OF THE SAME SECTION [J].

SIKLOS, L ;

ROZSA, M ;

ZOMBORI, J .

JOURNAL OF MICROSCOPY-OXFORD, 1986, 142 :107-110

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