CONCENTRATION DEPTH PROFILES BY XPS - A NEW APPROACH

被引：73

作者：

TOUGAARD, S ^{[1
]}

IGNATIEV, A ^{[1
]}

机构：

[1] UNIV HOUSTON,DEPT PHYS,HOUSTON,TX 77004

来源：

关键词：

D O I：

10.1016/0039-6028(83)90186-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：355 / 365

页数：11

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