DIRECT EVIDENCE FOR THE ROLE OF GOLD MIGRATION IN THE FORMATION OF DARK-SPOT DEFECTS IN 1.3-MU-M INP/INGAASP LIGHT-EMITTING-DIODES

被引：21

作者：

CHIN, AK

ZIPFEL, CL

GEVA, M

CAMLIBEL, I

SKEATH, P

CHIN, BH

机构：

来源：

APPLIED PHYSICS LETTERS | 1984年 / 45卷 / 01期

关键词：

D O I：

10.1063/1.94995

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：37 / 39

页数：3

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