THE MIGRATION OF GOLD FROM THE P-CONTACT AS A SOURCE OF DARK SPOT DEFECTS IN INP/INGAASP LEDS

被引：21

作者：

CHIN, AK

ZIPFEL, CL

ERMANIS, F

MARCHUT, L

CAMLIBEL, I

DIGIUSEPPE, MA

CHIN, BH

机构：

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1983年 / 30卷 / 04期

关键词：

D O I：

10.1109/T-ED.1983.21121

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：304 / 310

页数：7

相关论文

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