OBSERVATION OF DARK DEFECTS RELATED TO DEGRADATION IN INGAASP-INP DH LASERS UNDER ACCELERATED OPERATION

被引：25

作者：

FUKUDA, M

WAKITA, K

IWANE, G

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1981年 / 20卷 / 02期

关键词：

D O I：

10.1143/JJAP.20.L87

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：L87 / L90

页数：4

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共 8 条

[1] DEGRADATION OF CW GAAS DOUBLE-HETEROJUNCTION LASERS AT 300-K [J].

DELOACH, BC ;

HAKKI, BW ;

HARTMAN, RL ;

DASARO, LA .

PROCEEDINGS OF THE IEEE, 1973, 61 (07) :1042-1044

[2]

IMAI H, 1980, 7TH IEEE INT SEM LAS

[3] THERMAL DIAGNOSIS OF DARK LINES IN DEGRADED GAAS-ALGAAS DOUBLE-HETEROSTRUCTURE LASERS [J].

KOBAYASHI, T ;

KAWAKAMI, T ;

FURUKAWA, Y .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1975, 14 (04) :508-515

[4] LOW-TEMPERATURE LIQUID-PHASE EPITAXY GROWTH FOR ROOM-TEMPERATURE CW OPERATION OF 1.55-MU-M INGAASP-INP DOUBLE-HETEROSTRUCTURE LASER [J].

TAKAHEI, K ;

HAGAI, H ;

KAWAGUCHI, H .

APPLIED PHYSICS LETTERS, 1980, 36 (04) :309-310

[5] TRANSMISSION ELECTRON-MICROSCOPE OBSERVATION OF DARK-SPOT DEFECTS IN INGAASP-INP DOUBLE-HETEROSTRUCTURE LIGHT-EMITTING-DIODES AGED AT HIGH-TEMPERATURE [J].

UEDA, O ;

YAMAKOSHI, S ;

KOMIYA, S ;

AKITA, K ;

YAMAOKA, T .

APPLIED PHYSICS LETTERS, 1980, 36 (04) :300-301

[6] TRANSMISSION ELECTRON-MICROSCOPE OBSERVATION OF MECHANICALLY DAMAGED INGAASP-INP DOUBLE-HETEROSTRUCTURE LIGHT-EMITTING DIODE [J].

UEDA, O ;

YAMAKOSHI, S ;

YAMAOKA, T .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (05) :L251-L254

[7]

YAMAKOSHI S, 1978, 1978 INT EL DEV M WA, P642

[8] 10000-H CONTINUOUS CW OPERATION OF IN1-XGAXASYP1-Y-INP DH-LASERS AT ROOM-TEMPERATURE [J].

YAMAMOTO, T ;

SAKAI, K ;

AKIBA, S .

IEEE JOURNAL OF QUANTUM ELECTRONICS, 1979, 15 (08) :684-687