QUANTIFICATION OF HYDROGEN IN SURFACES AND THIN-FILMS USING A NON-DESTRUCTIVE FORWARD SCATTERING TECHNIQUE

被引：9

作者：

BARDIN, TT

PRONKO, JG

JOSHI, A

机构：

来源：

THIN SOLID FILMS | 1984年 / 119卷 / 04期

关键词：

D O I：

10.1016/0040-6090(84)90265-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：429 / 438

页数：10

共 8 条

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[7] HELIUM-INDUCED HYDROGEN RECOIL ANALYSIS FOR METALLURGICAL APPLICATIONS
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[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3): : 120 - 124
[8] PROFILING HYDROGEN IN MATERIALS USING ION-BEAMS
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[J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 19 - 39

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