ANALYSIS OF W/C MULTILAYERS BY AUGER-ELECTRON MICROSCOPY

被引：6

作者：

CHAUVINEAU, JP

机构：

来源：

THIN SOLID FILMS | 1983年 / 109卷 / 04期

关键词：

D O I：

10.1016/0040-6090(83)90188-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：353 / 361

页数：9

共 13 条

[1]

[Anonymous], AIP C P

[2]

Barbee Jr. T.W., 1981, AIP C P, V75, P131

[3] ELUCIDATION OF SURFACE-STRUCTURE AND BONDING BY PHOTOELECTRON-SPECTROSCOPY [J].

BRUNDLE, CR .

SURFACE SCIENCE, 1975, 48 (01) :99-136

[4] EVOLUTION OF SURFACE-ROUGHNESS ON THE ATOMIC LEVEL DURING THE COMPUTER-SIMULATED GROWTH OF A METALLIC FILM CONDENSED IN VACUUM [J].

CHAUVINEAU, JP .

JOURNAL OF CRYSTAL GROWTH, 1981, 53 (03) :505-514

[5] UTILIZATION OF SPECULAR X-RAY REFLECTION, DIFFUSE X-RAY REFLECTION OR PLANAR X-RAY REFLECTION TO STUDY THIN-FILMS OR SURFACES [J].

CROCE, P ;

NEVOT, L .

REVUE DE PHYSIQUE APPLIQUEE, 1976, 11 (01) :113-125

[6]

GASGNIER M, 1983, PHYS STATUS SOLIDI A, V79

[7] CHEMICAL EFFECTS IN AUGER-ELECTRON SPECTROSCOPY [J].

HAAS, TW ;

GRANT, JT ;

DOOLEY, GJ .

JOURNAL OF APPLIED PHYSICS, 1972, 43 (04) :1853-&

[8] SMOOTH MULTILAYER FILMS SUITABLE FOR X-RAY MIRRORS [J].

HAELBICH, RP ;

SEGMULLER, A ;

SPILLER, E .

APPLIED PHYSICS LETTERS, 1979, 34 (03) :184-186

[9] COMPARISON OF VARIOUS TYPES OF AUGER SIGNAL INTENSITY IN DIFFERENTIAL AND ENERGY-DISTRIBUTION MODE SPECTRA [J].

ISHIKAWA, K ;

KAWANO, H .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1979, 18 (06) :1187-1188

[10] TUNGSTEN AUGER TRANSITIONS - 150-200 EV [J].

RAWLINGS, KJ ;

HOPKINS, BJ ;

FOULIAS, SD .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1980, 18 (03) :213-225

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