共 35 条
- [1] RAMAN-SPECTROSCOPY - VERSATILE TOOL FOR CHARACTERIZATION OF THIN-FILMS AND HETEROSTRUCTURES OF GAAS AND ALXGA1-XAS [J]. APPLIED PHYSICS, 1978, 16 (04): : 345 - 352
- [3] BARRETT C, 1982, PHYSICA B, V117, P851
- [5] DAMBKES H, 1983, 8TH EUR SPEC WORKSH
- [8] DINGLE R, 1976, I PHYS C SER A, V33, P210
- [9] DINGLE R, 1975, ADV SOLID STATE PHYS, V15, P21