FAST SCANNING SPECTROELECTROCHEMICAL ELLIPSOMETRY - INSITU CHARACTERIZATION OF GOLD OXIDE

A study of the solid/liquid interface using a fast scanning spectroscopic ellipsometer with an optical multichannel analyzer (SE-OMA) is described. Here, we discuss the basic operating principles of the SE-OMA and, as an example of its application, report the optical properties and growth of monolayer gold oxide films formed on polycrystalline Au surfaces. These studies were performed using a specially-designed spectroelectrochemical cell operated with 0.5M H2SO4 under anodic potential. For the first time, spectroscopic ellipsometry measurements reveal the oxide dielectric function in real time from 1.5 to 3.3 eV. The thickness of the gold oxide was deduced to be approximately 4 Å at 1.3 V versus a saturated calomel reference electrode (SCE). © 1990.