X-ray diffuse-scattering study of interfacial morphology and conformal roughness in metallic multilayers

被引:21
作者
Paniago, R
Homma, H
Chow, PC
Moss, SC
Barnea, Z
Parkin, SSP
Cookson, D
机构
[1] UNIV MELBOURNE,SCH PHYS,PARKVILLE,VIC 3052,AUSTRALIA
[2] IBM CORP,ALMADEN RES CTR,DIV RES,SAN JOSE,CA 95120
[3] AUSTRALIAN NUCL SCI & TECHNOL ORG,MENAI,NSW 2234,AUSTRALIA
来源
PHYSICAL REVIEW B | 1995年 / 52卷 / 24期
关键词
D O I
10.1103/PhysRevB.52.R17052
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The nature of the interfacial roughness in Ni0.81Fe0.19/Au multilayers was studied using x-ray diffuse scattering. Using an image-plate detector this scattering could be observed to an extended momentum transfer. The roughness exponent and the cutoff length of the interfacial height-height self-correlation function could thereby be determined using a model of conformal roughness, for which the interfaces are smooth within the cutoff length. We also show that while the roughness is not conformal for short length scales, a transition to conformal behavior occurs from similar to 25 to 100 Angstrom.
引用
收藏
页码:17052 / 17055
页数:4
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