THE INFLUENCE OF EXPERIMENTAL PARAMETERS ON CONTRAST FORMATION IN MAGNETIC FORCE MICROSCOPY

被引:10
作者
KRAUSE, F
KAISINGER, F
STARKE, H
PERSCH, G
HARTMANN, U
机构
[1] UNIV SAARBRUCKEN, INST PHYS EXPTL, D-66041 SAARBRUCKEN, GERMANY
[2] FORSCHUNGSZENTRUM JULICH, INST THIN FILM & ION TECHNOL, D-52425 JULICH, GERMANY
关键词
MAGNETIC FORCE MICROSCOPY; CONTRAST FORMATION IN MFM; MAGNETIC THIN FILM DISCS;
D O I
10.1016/0040-6090(95)05856-7
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Remanent magnetization M(r) and coercivity H-c are important parameters of magnetic thin film discs. A matrix of different values of M(r) and H-c is investigated in order to study the influence of these parameters on the magnetic force microscopy (MFM) signal. MFM images of high-density bit structures in longitudinal storage media show several unexpected features, such as improved image contrast of structures of a certain bit length, depending upon the tip-sample separation. These effects are not affected by remanent magnetization and coercivity. A simple model for magnetic contrast formation is introduced. The influence of tip-sample separation, tip shape and tilt angle on the imaging of bit structures is demonstrated. Several bit structures are imaged by MFM. The images are compared with the results of the theoretical approach.
引用
收藏
页码:141 / 147
页数:7
相关论文
共 16 条
[1]  
DICARLO A, 1992, APPL PHYS LETT, V61, P2106
[2]   MAGNETIC FORCE MICROSCOPY - SOME REMARKS FROM THE MICROMAGNETIC POINT OF VIEW [J].
HARTMANN, U .
JOURNAL OF APPLIED PHYSICS, 1988, 64 (03) :1561-1564
[3]  
HARTMANN U, 1994, ADV ELECTRON EL PHYS, V87, P49
[4]   THE POINT DIPOLE APPROXIMATION IN MAGNETIC FORCE MICROSCOPY [J].
HARTMANN, U .
PHYSICS LETTERS A, 1989, 137 (09) :475-478
[5]   MAGNETIC FORCE MICROSCOPY WITH 25 NM RESOLUTION [J].
HOBBS, PCD ;
ABRAHAM, DW ;
WICKRAMASINGHE, HK .
APPLIED PHYSICS LETTERS, 1989, 55 (22) :2357-2359
[6]   FORCE MICROSCOPY OF MAGNETIZATION PATTERNS IN LONGITUDINAL RECORDING MEDIA [J].
MAMIN, HJ ;
RUGAR, D ;
STERN, JE ;
TERRIS, BD ;
LAMBERT, SE .
APPLIED PHYSICS LETTERS, 1988, 53 (16) :1563-1565
[7]   HIGH-RESOLUTION MAGNETIC IMAGING OF DOMAINS IN TBFE BY FORCE MICROSCOPY [J].
MARTIN, Y ;
RUGAR, D ;
WICKRAMASINGHE, HK .
APPLIED PHYSICS LETTERS, 1988, 52 (03) :244-246
[8]   MAGNETIC IMAGING BY FORCE MICROSCOPY WITH 1000-A RESOLUTION [J].
MARTIN, Y ;
WICKRAMASINGHE, HK .
APPLIED PHYSICS LETTERS, 1987, 50 (20) :1455-1457
[9]   APPLICATIONS OF MAGNETIC FORCE MICROSCOPY IN MAGNETIC STORAGE DEVICE MANUFACTURING [J].
PERSCH, G ;
STRECKER, H .
ULTRAMICROSCOPY, 1992, 42 :1269-1274
[10]  
POTTER RI, 1970, J APPL PHYS, V41, P1648