THE INFLUENCE OF SURFACE-STRUCTURE ON GROWTH OF SI(001)2X1 FROM THE VAPOR-PHASE

被引:32
作者
ROCKETT, A [1 ]
机构
[1] UNIV ILLINOIS,DEPT ENGN,MAT RES LAB,URBANA,IL 61801
关键词
D O I
10.1016/S0039-6028(05)80008-1
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Recent results of a Monte Carlo simulation of crystal growth on the (001) face of diamond-structure semiconductors are presented. The simulation suggests a relationship of the morphology of growing Si(001) crystal surfaces to defect structures, diffusion anisotropy, and the structure of clusters on specular surfaces and terrace edges on vicinal surfaces. The reconstruction is predicted to contain domain boundaries which are shown to be sites for preferential growth of new layers. The rate at which the domains form and their size oscillates during the growth of new monolayers on flat surfaces. The simulation results are based on an entirely kinetic model; very few terms resulting in driving forces due to reduction of total system energy are included. Most experimental observations can thus be accounted for without the need to introduce energy differences favoring certain configurations. Some discrepancies between the model results and observed morphologies cannot be accounted for by the kinetic model suggesting, for example, that some form of energy difference for adatoms adjacent to different sides of reconstruction dimers does occur. The model results provide a method for estimating fundamental properties such as the importance of dimer and second-nearest-neighbor interactions in determining the surface morphology and the populations of surface vacancies, clusters, and multiple-height surface steps. © 1990 Elsevier Science Publishers B.V. (North-Holland).
引用
收藏
页码:208 / 218
页数:11
相关论文
共 11 条
[1]   MONTE-CARLO SIMULATIONS OF SI(001) GROWTH AND RECONSTRUCTION DURING MOLECULAR-BEAM EPITAXY [J].
BARNETT, SA ;
ROCKETT, A .
SURFACE SCIENCE, 1988, 198 (1-2) :133-150
[2]   STABILITIES OF SINGLE-LAYER AND BILAYER STEPS ON SI(001) SURFACES [J].
CHADI, DJ .
PHYSICAL REVIEW LETTERS, 1987, 59 (15) :1691-1694
[3]   NUCLEATION AND GROWTH OF EPITAXIAL SILICON ON SI(001) AND SI(111) SURFACES BY SCANNING TUNNELING MICROSCOPY [J].
HAMERS, RJ ;
KOHLER, UK ;
DEMUTH, JE .
ULTRAMICROSCOPY, 1989, 31 (01) :10-19
[4]   DETERMINATION OF THE LOCAL ELECTRONIC-STRUCTURE OF ATOMIC-SIZED DEFECTS ON SI(001) BY TUNNELING SPECTROSCOPY [J].
HAMERS, RJ ;
KOHLER, UK .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (04) :2854-2859
[5]  
Herman M.A., 1989, MOL BEAM EPITAXY FUN
[6]  
Rockett A., 1988, Proceedings of the SPIE - The International Society for Optical Engineering, V944, P63, DOI 10.1117/12.947363
[7]   MONTE-CARLO SIMULATIONS OF THE GROWTH OF DIAMOND-STRUCTURE SEMICONDUCTORS AND SURFACE-REFLECTED ELECTRON-BEAM INTENSITIES DURING MOLECULAR-BEAM EPITAXY [J].
ROCKETT, A .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1988, 6 (02) :763-766
[8]   SCANNING TUNNELING MICROSCOPY STUDIES OF STRUCTURAL DISORDER AND STEPS ON SI SURFACES [J].
SWARTZENTRUBER, BS ;
MO, YW ;
WEBB, MB ;
LAGALLY, MG .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (04) :2901-2905
[9]  
TELEIPS W, 1987, APPL PHYS A, V44, P55
[10]   NEW EMPIRICAL-APPROACH FOR THE STRUCTURE AND ENERGY OF COVALENT SYSTEMS [J].
TERSOFF, J .
PHYSICAL REVIEW B, 1988, 37 (12) :6991-7000