HIGH-RESOLUTION SECONDARY-ELECTRON IMAGING AND SPECTROSCOPY

被引：37

作者：

BLELOCH, AL

HOWIE, A

MILNE, RH

机构：

来源：

ULTRAMICROSCOPY | 1989年 / 31卷 / 01期

关键词：

D O I：

10.1016/0304-3991(89)90039-9

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：99 / 110

页数：12

共 45 条

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